Title: Statistical Methods for Industrial Process Control US buyers can pay by credit card with PayPal or Google checkout.
SIGNED and inscribed by the author.
Emphasizing the practical application of statistical tools, this outstanding
volume gives engineers and students a solid introduction to the sophisti-
cated techniques used in semiconductor manufacture and fabrication.
By: David Drain
ISBN: 0-412-08511-9
Publisher: Chapman & Hall/ITP, New York, NY
Copyright: 1997, First Edition, First Printing
Size/Format: 6 1/4" x 9 1/4", glossy hardcover, no dust jacket as issued,
456 pages.
Condition: Very Good. Very clean & crisp, tight pages, no markings or
highlighting. Rubbing & minor wear on covers.
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